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Device under test
Device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing.
==Electronics testing==
The term DUT is used within the electronics industry to refer to any electronic assembly under test. For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT.
The DUT is often connected to the test equipment using a bed of nails tester of pogo pins.
抄文引用元・出典: フリー百科事典『 ウィキペディア（Wikipedia）』
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